- Crystallographic statistics.
- Development of exact probabilistic approaches to structure-factor
statistics and unambiguous determination of space group symmetry.
- Effects of atomic heterogeneity, presence of atoms in special
positions and presence of dispersive scatterers on intensity
- Exact and approximate probabilistic treatments of low-order
structure invariants, for direct methods of phase determination.
- Resonant scattering of X-rays; Friedel intensity differences.