Research Facilities

 

 

Currently the Centre has nine groups of characterization systems, which are fully operational:

Scanning Auger electron spectroscopy/X-ray photoelectron spectroscopy (AES/XPS) system for surface composition analysis.

X-ray diffraction (XRD) machines for structural characterization of crystals, films and powders;

Scanning electron microscope (SEM) for morphological analysis, equipped with energy dispersive spectroscopy system (EDS) for bulk compositional determination.

Scanning probe microscope (SPM) for high resolution imaging surface;
Field Emission Gun Environmental Scanning Electron Microscope (ESEM)
Field emission gun - transmission electron microscope (FEG-TEM) for high resolution

Thermo gravimetric analyzer (TGA) and differential scanning calorimeter (DSC) for materials lifetime studies;

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) for top surface layers composition analysis;

Clean room class 1000

Quantum Design MPMS XL-5 SQUID Magnetometer;