AES-XPS Laboratory

Scanning 5600 AES/XPS multi-technique system (PHI, USA) is a state-of-the-art analytical tool for chemical analysis of any solid material, ranging from Li to U. It can determine the chemical composition of surfaces not only by their atomic content but also by the chemical bonding of the surface atoms.
The main characteristic features of our AES/XPS system are summarized in the following table:
Technique Information

Detection Limits

Imaging, mapping Analysis area

Elemental composition,  Li-U

0.1-1 at% yes Syb00.jpg (786 bytes)100 nm

Elemental composition and chemical bonding  Li-U

0.01-1 at% yes 30Syb01.jpg (940 bytes) – 2 mm

Examples of Activity