email: srichter@post.tau.ac.il
Voice: 972-3-6405711
Fax: 972-3-6405612
Building: Library of Exact Sciences
Room: 001

More information about the Richter group...


  • Molecular and bio-molecular Electronics: The nature of conductivity of organic molecules, molecular devices and circuits, bio-organic interconnections and sensors


  • Self-Assembled monolayers- dynamic of adsorption


  • Scanning Probe Microscopy- development of novel methods for electrical characterization of molecular and nanostructures




1. Electron spin resonance-scanning tunneling microscopy experiments of thermally oxidized Si(111) Y.Manassen, E Ter-Ovenesyan, D. Shachal and S. Richter Pys. Rev. B 48 4887 (1993).

2. Aspect of molecular imaging with scanning tunneling microscope
S. Richter and Y. Manassen
J.Phys. Chem 98(11) 2941 (1994).

3. Electronic effects of ion mobility in semiconductors: Mixed electronic-ionic behavior and device creation in Si:Li. L. Chernyak, V. Lyakhovitskaya S. Richter, A. Jakubowicz, S. Cohen and D. Cahen J. Appl. Phys 80(5) 2749(1996)

4. Growth and Characterization of Twin-free CuInSe2 Crystals by the Traveling Heater Method V.Lyakohvitskaya, S. Richter, Y. Manassen and D.Cahen. Inst. Phys. Conf. Ser., 152, 103(1998)

5. Sub-m semiconductor Device Structures in CuInSe2 S. Richter V. Lyakhvitskaya , S. Cohen K. Gartsman D. Cahen and Y. Manassen. Inst. Phys. Conf. Ser. 152, 943(1998)

6. Fabrication and Detection of Bulk, Sub-m Semiconductor Device Structures using Scanning Probe Microscopy. S. Richter, V. Lyakhvitskaya, S.Cohen, K. Gartsman D. Cahen and Y. Manassen .Appl. Phys. Lett. 73,1868 (1998)

7. Growth of CuInSe2 crystals by the traveling Heater Method and their characterization. V. Lyakhovitskaya, S. Richter, Y. Manassen and D. Cahen, J. Cryst. Growth. 197: (1-2) 177 (1999)

8. Bulk changes in Semiconductors using Scanning Probe Microscope: A way to fabricated structures S. Richter, Y. Manassen, D. Cahen, Phys. Rev. B 59: (16) 10877 (1999)

9. SSRM analysis os Dopant diffusion in InP-Based structures M. Geva,, Y. Akulova, A. Ougazzaden, J. P. Holman, S. Richter and R.N. Kleiman Proceeding of IPRM (IEEE), p.48 (Williamsburg 2000)

10. Characterization of InP using Metal-Insulator Semiconductor Tunneling microscopy . S. Richter, J.P. Garno, M. Geva and R. N. Kleiman. Proceeding of IPRM(IEEE), p.64 (Williamsburg 2000).

11. Metal-Insulator-semiconductor tunneling microscopy: Two-dimensional dopant profiling of semiconductors with conducting atomic-force microscopy S. Richter, M. Geva, J. P. Garno and R. N. Kleiman. Appl. Phys. Lett. 77 456 (2000)

12. Impurity band in the interfacial region of GaN films grown by hydride vapor phase epitaxy. JWP Hsu, DV Lang, S Richter, RN Kleiman, AM Sergent, DC Look, RJ Molnar J ELECTRON MATER 30 (3): 115 (2001)

13. Nature of the highly conducting interfacial layer in GaN films Hsu, J.W.P.; Lang, D.V.; Richter, S.; Kleiman, R.N.; Sergent, A.M.; Molnar, R.J. Appl. Phys. Lett. 77,2873 (2000)

14. Inhomogeneous spatial distribution of reverse bias leakage in GaN Schottky diodes J.W.P Hsu,.; M.J Manfra,.; D.V Lang,.; S Richter,.; S.N.G Chu,.; A.M Sergent,.; R.N Kleiman,.; L.N Pfeiffer,.; R.J Molnar,. Appl. Phys. Lett.. 78, 1685 (2001)

15. Spatial Variation of Electrical Properties in Lateral Epitaxial Overgrown GaN J. W. P. Hsu, D. V. Lang, M. J. Matthews, S. Richter, D. Abusch-Magder, R. N. Kleiman, S. L. Gu and T. F. Kuech. Appl. Phys. Lett 79, 761(2001)

16. An Exchange method for adsorbtion of Self Assembled monolayer composed of dithiol molecules G. Meshulam, M. Gozin and S. Richter. Submitted.

17. Dual polarity current amplifier with 14 decades of amplification, R. Kleiman and S. Richter, US Patent Application (2003)

18. Sub-picoamp amplifier with high bandwidth for SPM applications, R. Kleiman and S. Richter, US Patent Application (2003)

19. Capacitance sensor for SPM applications, R. Kleiman and S. Richter. US Patent Application (2003)

20. Nanopotentiometry sensor for SPM applications, R. Kleiman and S. Richter. US Patent Application (2003)

21. Special Presentation: Agere systems educational series: Application of Scanning Probe Microscopy for electrical Measurements of III-V devices - Shachar Richter (available on videotape- about 90 min.)